Smart Manufacturing: Requirements, Standards, and Solutions for the Back End

By: Alan Weber, Director New Product Innovations, Cimetrix

Data collection is the principal enabling technology for maintaining a Smart Assembly Factory's "digital twin". The diversity of data sources in Smart Manufacturing environments is growing, not shrinking, and the semiconductor back-end area presents unique challenges not found in front-end wafer fabrication. The goal of this presentation is to show how to leverage existing industry standards and modern solution technologies to accelerate back-end automation to increase the back-end ability to better embrace smart manufacturing. 

Specific reasons to increase the smart manufacturing environment in back-end factories include the following:

• Demands by consumer product customers for equipment data to support quality and supply chain optimization initiatives
• Need better event/status data to support automated calculation of OEE and other manufacturing KPIs
• Broader deployment of multivariate FDC, which requires more trace data parameters than operational monitoring
• Actual feedback control based on back-end metrology (e.g., saw performance optimization using kerf data) and inspection data. 

Find out more by downloading the material available by filling out the form, or schedule a meeting with a Cimetrix representative.